Research Group Computed Tomography

University of Applied Sciences Upper Austria - Research & Development Ltd.

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Conference on Industrial Computed Tomography (ICT)
19th to 21st of September 2012 at our Campus

Upper Austrian University of Applied Sciences Wels Campus
in Cooperation with ÖGfZP (Österreichische Gesellschaft für zerstörungsfreie Prüfung), DGZfP (Deutsche Gesellschaft für zerstörungsfreie Prüfung), SGZP (Schweizerische Gesellschaft für zerstörungsfreie Prüfung) and DGM (Deutsche Gesellschaft für Materialkunde)

September 19th, 2012:   Non-destructive Testing and 3D Materials Characterization
September 20th, 2012:   Dimensional Measurement
September 21st, 2012:   Industry Day - Lectures for CT users and operators (in German, free entry)

Venue: University of Applied Sciences Upper Austria, Campus Wels, Stelzhamerstrasse 23, 4600 Wels / Austria
Conference language: English

Important dates:
Submission deadline for abstracts: 31. January 2012
Notification of acceptance of papers: 12. March 2012
Submission deadline for full papers: 13. June 2012
Announcement of a poster until: 31. July 2012

Industrial X-ray computed tomography is a method whose relevance has increased more and more because of its great advantages. CT is a non-destructive method, for 3-dimensional measuring of components, to find hidden errors (e.g. shrink hole, cracks, inclusions, pores etc.) in the depth of an material and to determine physical variables like porosity and density. CT allows the inspection and measurement of hidden and inaccessible specimen characteristics, which is not possible with other techniques. Within this conference the current state-of-the-art and new developments in the following areas will be published.

  • CT for non-destructive testing of metals, plastics, composites, ceramics and other materials
  • Application of CT in automotive-, aerospace- and material industry
  • CT as a tool for the development of new materials and components
  • CT for 3D material characterization
  • Geometry determination with macro- and micro-CT
  • Initial sampling inspection and reverse engineering
  • Evaluation and visualization of CT data
  • CT: from imaging inspection equipment to calibrated measurement equipment
  • How to measure with CT?
  • New algorithms und software tools for the evaluation and visualization of CT data
  • Correction and- filter methods for the improvement of CT results
  • Quantitative evaluation of CT data
  • Standardization of CT (e.g. VDI/VDE-GMA: Technical Committee “Computed Tomography for Metrology”)
  • New CT methods for high resolution, energy dispersive and fast CT
  • Synchrotron-CT methods
  • New developments in CT instrument technology including X-ray detectors and sources



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Last Updated on Thursday, 04 October 2012 08:39  




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